Low probability breakdown
voltage esimtion for the new step-up test method
Authors
廣瀬
Hideo Hirose
Source
統計数理, Vol.52, No.1, pp.175-187 (平成16.6)
Proceedings of the Institute of Statistical
Mathematics, Vol.52, No.1, pp.175-187 (2004.6)
Abstract
The conventional step-up test method has been used to estimate
the impulse breakdown voltages used in the field of the field of
electrical insulation engineering. This method uses two-valued discrete
data according to the result of insulation broken or non-broken
information. We can now accurately measure impulse waveforms by
recently developed fast memorable measuring equipment. With this
equipment, we can observe the continuous breakdown voltage data,
resulting in more accurate breakdown voltage estimates. We call
this method the new step-up test method. This article discusses
the optimum test method in both the conventional and new test methods,
and compare the estimating errors of the low probability breakdown
voltages in both methods.
Key Words
Keywords: impulse breakdown voltage, step-up
method, new step-up method, step-up distance, normal
distribution, Weibull distribution, gumbel distribution