Title
Theoretical Foundation for Residual Lifetime Estimation
Authors
H. Hirose
Source
Transactions of IEEJ, Vol. 116-B, No.2, pp.168-173 (1996.2)
Abstract
This paper shows a method, in the Weibull-power model, of estimating the parameters and the residual lifetime of insulation which had been under the specified service voltage stress for a long period. The deterioration model is assumed to include a threshold stress below
which a breakdown will not occur. When a presumptive threshold is higher than the service voltage stress, the insulation will not deteriorate at all. In such a case, a hypothesis test which determines whether the threshold is higher than the service stress is shown; the test can also support the existence of a strictly positive threshold. These methods will be applicable to the residual lifetime analysis for cross-linked polyethylene insulated cables which had been used for decades. Some simulated examples are demonstrated.
Key Words

Weibull-power model, resisual lifetime, threshold stress,
accelerated life-test, step-stress test, maximum likelihood estimation

Controlled Indexing:insulation testing; life testing; maximum likelihood estimation; power cable insulation; Weibull distribution; XLPE insulation
Uncontrolled Indexing:residual lifetime estimation; Weibull-power model; insulation; service voltage stress; threshold stress; cross-linked polyethylene insulated cables; accelerated life testing; step stress test; maximum likelihood estimation
Citation

　

Times Cited in Web of Science: 6

Times Cited in Google Scholar: 20

http://scholar.google.co.jp/scholar?cites=16698950692106099186&hl=ja&num=100&as_sdt=2000

Cited in Books:

Inspec: 1

WoS: IEEE TRANSACTIONS ON RELIABILITY 巻: 61 号: 3 ページ: 625-633 DOI: 10.1109/TR.2012.2207575 発行: SEP 2012; IEEE International Conference on Dielectric Liquids 開催地: Poitiers, FRANCE 日付: JUN, 2008 出版物名: IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻: 16 号: 6 ページ: 1755-1760 発行: DEC 2009; International Multi-Conference of Engineers and Computer Scientists IMECS 2009: INTERNATIONAL MULTI-CONFERENCE OF ENGINEERS AND COMPUTER SCIENTISTS, VOLS I AND II シリーズタイトル: Lecture Notes in Engineering and Computer Science ページ: 1402-1406 発行: 2009; JOURNAL OF APPLIED STATISTICS 巻: 33 号: 1 ページ: 17-34 DOI: 10.1080/02664760500389475 発行: JAN 2006; PROCEEDINGS OF THE 7TH INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1-3 ページ: 978-981 発行: 2003; MATERIALS CHEMISTRY AND PHYSICS 巻: 66 号: 1 ページ: 70-76 DOI: 10.1016/S0254-0584(00)00272-8 発行: SEP 15 2000

etc: ICPADM2003, pp.978-98; IEEJ Trans. B, Vol.124, No.7, pp.977-983 (2004); IEEE Trans. DEI Vol.13, pp. 146-159; IEEJ Trans. B, Vol.126, No.7, pp.694-700 (2006); Cited in IEEJ Trans. B, 127, pp.1299-1305 (2007)