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The Extended Cumulative Exposure Model (ECEM)
and Its Application to Oil Insulation Test
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Hideo Hirose, Takenori Sakumura
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IEEE Transactions on Reliability,
Vol.61, No.3, pp.625-633 (2012.9), DOI 10.1109/TR.2012.2207575
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cumulative exposure model (CEM) is often used to express the failure
probability model in step-stress accelerated life test (SSALT).
This probability model is widely accepted in reliability fields
because accumulation of fatigue is considered to be reasonable.
Contrary to this, the memoryless model (MM) is also used in electrical
engineering because accumulation of fatigue is not observed in
some cases. We propose here a new model, the extended cumulative
exposure model (ECEM), which includes features of both the described
models. A simulation study and applications to the actual experimental
cases support the applicability of the proposed model. The independence
model (IM) is also critically discussed. |
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step-stress accelerated life test, cumulative exposure
model, memoryless model, extended cumulative exposure model,
independence model.
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Times Cited in Web of Science: 1
Times Cited in Google Scholar: 1
Cited in Books:
Inspec:
WoS: COMPUTERS & INDUSTRIAL
ENGINEERING 巻: 72 ページ: 106-113 発行: JUN 2014
Others:
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