H. Hirose

This paper describes a new statistical method of lifetime estimation of a solid electrical insulation using data from an accelerated aging test. The method simultaneously uses the maximum likelihood estimation and the Newton-Raphson methods. The novel aspect of this work is the introduction of a new threshold term in addition to well-known estimation techniques based on the inverse power model combined with the Weibull distribution. Thus, we can estimate the threshold value with a confidence interval. In order to reduce time and costs of voltage-lifetime test, an accelerated testing procedure with type I censoring is considered.

　

Times Cited in Web of Science: 35

Times Cited in Scopus:

Times Cited in Google Scholar: 43

Cited in Books: Vilijandas Bagdonavicius, Mikhail Nikulin, Accelerated Life Models: Modeling and Statistical Analysis, Chapman & Hall/CRC (2001)

WoS: IEEE TRANSACTIONS ON RELIABILITY 巻: 63 号: 2 ページ: 523-533 発行: JUN 2014; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻: 19 号: 4 ページ: 1400-1411 発行: AUG 2012; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻: 19 号: 4 ページ: 1400-1411 発行: AUG 2012; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻: 19 号: 2 ページ: 460-471 発行: APR 2012; IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 巻: 60 号: 5 ページ: 1674-1681 DOI: 10.1109/TIM.2010.2102392 発行: MAY 2011; IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 巻: 60 号: 5 ページ: 1674-1681 発行: MAY 2011; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻: 17 号: 6 ページ: 1863-1868 発行: DEC 2010; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻: 17 号: 6 ページ: 1869-1876 発行: DEC 2010; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻: 17 号: 5 ページ: 1657-1664 発行: OCT 2010; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻: 17 号: 3 ページ: 978-983 発行: JUN 2010; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 17 312-322 FEB 2010 ; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 15 (5) 1242-1251 OCT 2008; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 15 (5) 1261-1270 OCT 2008; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 15 (5) 1271-1280 OCT 2008; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 13 (2): 436-444 APR 2006 ; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 9 (5): 730-745 OCT 2002; IEEE TRANSACTIONS ON RELIABILITY 48 (2): 176-181 JUN 1999; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 4 (6): 674-680 DEC 1997; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 4 (5): 496-506 OCT 1997; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 3 (2): 237-247 APR 1996; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 2 (4): 667-675 AUG 1995; IEEE TRANSACTIONS ON RELIABILITY 42 (4): 650-657 DEC 1993; IEEE TRANSACTIONS ON ELECTRICAL INSULATION 28 (5): 755-776 OCT 1993; IEEE TRANSACTIONS ON ELECTRICAL INSULATION 28 (5): 777-788 OCT 1993; IEEE TRANSACTIONS ON ELECTRICAL INSULATION 27 (5): 974-986 OCT 1992; IEEE TRANSACTIONS ON ELECTRICAL INSULATION 27 (5): 987-999 OCT 1992; IEEE TRANSACTIONS ON ELECTRICAL INSULATION 27 (5): 1000-1008 OCT 1992; IEEE TRANSACTIONS ON RELIABILITY 41 (3): 466-468 SEP 1992; IEEE TRANSACTIONS ON POWER DELIVERY 7 (2): 634641 APR 1992; JOURNAL OF PHYSICS D-APPLIED PHYSICS 23 (12): 1592-1598 DEC 14 1990; IEEE TRANSACTIONS ON ELECTRICAL INSULATION 25 (5): 923-934 OCT 1990; IEEE TRANSACTIONS ON ELECTRICAL INSULATION 24 (5): 741-764 OCT 1989; IEEE TRANSACTIONS ON ELECTRICAL INSULATION 24 (1): 135-137 FEB 1989