Title
Basic Study of Fitting Method for Base Curve Extraction in Lightning Impulse Test Techniques

Authors
S. Okabe, T. Tsuboi, G. Ueta, J. Takami, H. Hirose

Source
IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 17, No. 1, pp. 2-4 (2010.2)

Abstract

The IEC, which defines the lightning impulse test techniques for electric power equipment, is about to introduce the k-factor method for evaluating overshoot of impulse waveforms. In its procedure, it is defined that waveforms are fitted with a double exponential function to derive a base curve. For some waveforms, however, there are sometimes deviations upward from the central lines of the recorded waveforms in the wavefront area. This paper examines a more rational method of extracting a base curve in consideration of the relationship between equivalent electric circuits and solutions of governing equations. The trial calculation with the new method gives results with lower crest values and slower rises than with the existing method.


Key Words
Lightning impulse test, base curve, double exponential, IEC 60060-1.

Citation

 

Times Cited in Web of Science: 8

Times Cited in Google Scholar: 13

Cited in Books:

WoS: IEEE TRANSACTIONS ON POWER DELIVERY 巻: 28 号: 1 ページ: 531-533 DOI: 10.1109/TPWRD.2012.2213172 発行: JAN 2013; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻: 19 号: 1 ページ: 352-362 発行: FEB 2012; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻: 18 号: 5 ページ: 1734-1742 発行: OCT 2011 ; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻: 18 号: 3 ページ: 783-791 発行: JUN 2011; PRZEGLAD ELEKTROTECHNICZNY 巻: 86 号: 11B ページ: 304-307 発行: 2010; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻: 17 号: 6 ページ: 1912-1921 発行: DEC 2010; PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER 巻: 108 ページ: 361-383 発行: 2010; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 巻: 17 号: 4 ページ: 1336-1345 発行: AUG 2010

Others: