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Analytical Evaluation of Dielectric Breakdown
Test Based on One-minute Step-up Method
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Toshihiro Tsuboi*, Jun Takami*, Shigemitsu Okabe*,
Hideo Hirose**, and Kotaro Tsuru**
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IEEE Trans., Dielectrics
and Electrical Insulation, Vol.16, No.5, pp.1393-1396 (2009.10)
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The authors previously pointed out that the results of insulation
tests based on the one- minute step-up method deviate from the
gtrue valuesh obtained from the V-t characteristic test. This
study evaluated these deviations using equations, and confirmed
through analysis the deviations from true values of those in
the test based on the one-minute step-up method. These deviations
were found to exist not only under limited conditions in numerical
simulations but to exist universally. This will be a noteworthy
finding when making actual insulation designs.
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Power-frequency withstand voltage test,
one-minute step-up method, reliability evaluation, Weibull
distribution
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