Maximum likelihood parameter estimation in the extended Weibull distribution and its applications to breakdown voltage estimation

Hirose H

IEEE Trans., Dielectrics and Electrical Insulation, Vol.9, No.4, pp. 524-536 (2002.8)

Although the Weibull distribution is widely used in a variety of reliability applications, difficulties in its treatment, particularly in three parameter cases in the maximum likelihood estimation, hinder us from using the distribution. The extended Weibull distribution proposed by Marshall and Olkin (1997) can avoid the difficulties which appear in the conventional Weibull distribution models. This paper shows the maximum likelihood estimation method in the extended Weibull distribution model. The paper also illustrates some typical applications for breakdown voltage estimation in which the extended models are superior to the conventional Weibull models. The central discussion is whether the shape parameters in the extended model accomplish the mass shifting effect of the distribution.

　

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WoS: COMMUNICATIONS IN STATISTICS-THEORY AND METHODS 巻: 43 号: 10-12 特別号: SI ページ: 2342-2356 発行: MAY 15 2014; IEEE TRANSACTIONS ON RELIABILITY 巻: 60 号: 1 ページ: 219-233 DOI: 10.1109/TR.2010.2085574 発行: MAR 2011; IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 巻: 10 号: 2 ページ: 263-270 発行: JUN 2010; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION Volume: 15 1044-1050 AUG 2008; IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 10 (1): 186-186 FEB 2003