The Relation Between Accelerated Life Tests by
Brand-new Insulation and Step-up Voltage Tests by Working Insulation
Authors
H. Hirose
Source
"7th International Conference on Properties and Applications
of Dielectric Materials (ICPADM2003)", pp.978-981, June
1-5, 2003, Meitetsu New Grand Hotel, Nagoya, Japan
Abstract
Accelerated life tests using the brand-new electrical insulation
have long been used to estimate the lifetime of the insulation.
Although a variety of types of stresses are imposed on the insulation
in the accelerated life tests, the insulation is often broken more
quickly than the estimated lifetime due to unexpected deterioration
factors. The step-up breakdown voltage tests using the working
insulation are then performed to assess the actual remaining lifetime
of the insulation. However, theoretical explanations of the relation
between these two test methods have not been made rigorously. One
way to combine these two may be the cumulative exposure model proposed
by Nelson, or Sedyakin model which is usually applied to short
time accelerated life testing. This paper shows that Sedyakin model
is also useful to assess the actual remaining lifetime using the
inspection breakdown voltage data, although the relation between
the duration of use and the electrical strength in breakdown voltage
data seems to differ from the relation between the imposed stress
and the lifetime in the accelerated life test data.
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Key Words
Degradation , Dielectrics and electrical
insulation , Insulation testing , Life estimation , Life
testing , Lifetime estimation , Performance evaluation ,
Random variables , Stress , Voltage control